SEMICONDUCTOR DEVICE AND VEHICLE

To inhibit cracks from occurring in a wire and disconnection of the wire in a semiconductor device in which a connection structure of a lead frame and the wire on the semiconductor device is sealed with a solid resin.SOLUTION: A semiconductor device (1) is formed including: a substrate (6); a semico...

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1. Verfasser: HAYAKAWA TSUTOMU
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To inhibit cracks from occurring in a wire and disconnection of the wire in a semiconductor device in which a connection structure of a lead frame and the wire on the semiconductor device is sealed with a solid resin.SOLUTION: A semiconductor device (1) is formed including: a substrate (6); a semiconductor element (4) disposed on an upper surface of the substrate (6); a lead frame (2) joined to an upper surface of the semiconductor element (4) through a joint material (18); a wire (7) connected to an upper surface of the lead frame (2); and a sealing material (R) which seals the substrate (6), the semiconductor element (4), the lead frame (2), and the wire (7). The lead frame (2) has first protruding parts (20) around a connection portion (A) connected with the wire (7).SELECTED DRAWING: Figure 1 【課題】半導体装置上のリードフレームとワイヤとの接続構造を固形樹脂で封止する半導体装置において、ワイヤにクラックが生じたりワイヤが断線したりすることを抑制する。【解決手段】基板(6)と、基板(6)の上面に配置される半導体素子(4)と、半導体素子(4)の上面に接合材(18)を介して接合されるリードフレーム(2)と、リードフレーム(2)の上面に接続されるワイヤ(7)と、基板(6)、半導体素子(4)、リードフレーム(2)、及びワイヤ(7)を封止する封止材(R)とを備えて半導体装置(1)を構成し、リードフレーム(2)は、ワイヤ(7)との接続部分(A)の周囲に第1凸部(20)を有する。【選択図】図1