COLLECTING DEVICE, SCANNING ION CONDUCTANCE MICROSCOPE PROVIDED WITH THE SAME, AND COLLECTING METHOD

To provide a collecting device which allows precise suction and discharge on micro level, which has been impossible by the conventional voltage control techniques, and also allows increases in the amounts of suction and discharge, and a scanning electrochemical probe microscope provided with the sam...

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Bibliographische Detailangaben
Hauptverfasser: IDA HIROKI, KUMAGAI AKIYA
Format: Patent
Sprache:eng ; jpn
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