THICKNESS MEASURING DEVICE AND METHOD FOR MEASURING THICKNESS

To reduce the influence of the temperature of a measurement environment in a measurement of the thickness of a target object.SOLUTION: A thickness measuring device 10 includes: an excitation unit 71 for applying an excitation current to an excitation coil 11 and inducing an eddy current in a target...

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Bibliographische Detailangaben
1. Verfasser:	TOKIOKA YOSHINORI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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