METHOD FOR MANUFACTURING ELECTROLESS PLATING SILICON WAFER
To provide a method for manufacturing an electroless plating silicon wafer, capable of easily cutting a bottom surface resin film of the electroless plating silicon wafer, easily peeling the cut bottom surface resin film and preventing a plating film from being formed in the end part of the silicon...
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Format: | Patent |
Sprache: | eng ; jpn |
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Zusammenfassung: | To provide a method for manufacturing an electroless plating silicon wafer, capable of easily cutting a bottom surface resin film of the electroless plating silicon wafer, easily peeling the cut bottom surface resin film and preventing a plating film from being formed in the end part of the silicon wafer when performing electroless plating, and provide a method for manufacturing an electroless plating layer containing silicon wafer.SOLUTION: A method for manufacturing an electroless plating silicon wafer comprises: providing a device surface resin film 2 including a flange 2a and an opening 2b projected from an end part 1d of a silicon wafer 1 on a device surface 1a of the silicon wafer 1; providing a bottom surface resin film 3 including a flange 3a projected from the end part 1d of the silicon wafer 1 on a bottom surface 1b of the silicon wafer 1; and forming a space 4 in a boundary among the end part 1d of the silicon wafer 1, the device surface resin film 2 and the bottom surface resin film 3 to integrate the flange 2a of the device surface resin film 2 and the flange 3a of the bottom surface resin film 3.SELECTED DRAWING: Figure 1
【課題】無電解めっき用シリコンウェハの底面用樹脂フィルムを容易に切断することができ、切断された底面用樹脂フィルムを容易に剥離することができ、無電解めっきを施すときにシリコンウェハの端部でめっき皮膜が形成されることを防止することができる無電解めっき用シリコンウェハの製造方法および無電解めっき層含有シリコンウェハの製造方法を提供する。【解決手段】シリコンウェハ1のデバイス面1aにシリコンウェハ1の端部1dから突出する鍔部2aおよび開口部2bを有するデバイス面用樹脂フィルム2を設け、シリコンウェハ1の底面1bにシリコンウェハ1の端部1dから突出する鍔部3aを有する底面用樹脂フィルム3を設け、シリコンウェハ1の端部1dとデバイス面用樹脂フィルム2と底面用樹脂フィルム3との境界に空間4を形成させてデバイス面用樹脂フィルム2の鍔部2aと底面用樹脂フィルム3の鍔部3aとを一体化させることを特徴とする。【選択図】図1 |
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