SURFACE PROPERTY MEASUREMENT DEVICE AND SURFACE PROPERTY MEASUREMENT METHOD

To provide a surface property measurement device and a surface property measurement method that can convert a strain of a reflected image into numbers to quantitatively evaluate the strain.SOLUTION: A surface property measurement device 10 is provided which has an irradiation unit 2 that irradiates...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HORI MITSUKI, SUGAYA RYO, KIMURA AKI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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