ANALYZER, ANALYSIS METHOD, AND ANALYSIS PROGRAM
To provide an analyzer capable of improving analysis accuracy when analyzing the composition of a material to be measured based on spectral data.SOLUTION: An analyzer 20 includes: an acquisition unit 200 that acquires measurement data MD, which is spectral data of a material to be measured, and mult...
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| creator | SHIRATORI HANAE YANO MASAO ITAKURA TOMOYA |
| description | To provide an analyzer capable of improving analysis accuracy when analyzing the composition of a material to be measured based on spectral data.SOLUTION: An analyzer 20 includes: an acquisition unit 200 that acquires measurement data MD, which is spectral data of a material to be measured, and multiple reference data RD, which are the spectral data of the candidate components; a detection unit 210 that detects an index of the peak value on the acquired measurement data MD; a configuration unit 220 that reconfigures the measurement data MD based on the index of detected measurement data MD; and an estimation unit 230 that estimates the composition of the material under test by regressing using Lasso regression, which is the reconstructed measurement data MD of non-negative linear least squares.SELECTED DRAWING: Figure 2
【課題】スペクトルデータに基づいて被測定材料の成分を解析する場合において、解析精度の向上を図ること。【解決手段】解析装置２０は、被測定材料のスペクトルデータである測定データＭＤ、及び候補となる成分のスペクトルデータである複数の参照データＲＤを取得する取得部２００と、取得された測定データＭＤに対し、ピーク値のインデックスを検出する検出部２１０と、検出された測定データＭＤの前記インデックスに基づいて測定データＭＤを再構成する構成部２２０と、各参照データＲＤに対して再構成された測定データＭＤを非負の線形最小二乗法であるラッソ回帰を用いて回帰することで、前記被測定材料の成分を推定する推定部２３０と、を備えている。【選択図】図２ |
| format | Patent |
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【課題】スペクトルデータに基づいて被測定材料の成分を解析する場合において、解析精度の向上を図ること。【解決手段】解析装置２０は、被測定材料のスペクトルデータである測定データＭＤ、及び候補となる成分のスペクトルデータである複数の参照データＲＤを取得する取得部２００と、取得された測定データＭＤに対し、ピーク値のインデックスを検出する検出部２１０と、検出された測定データＭＤの前記インデックスに基づいて測定データＭＤを再構成する構成部２２０と、各参照データＲＤに対して再構成された測定データＭＤを非負の線形最小二乗法であるラッソ回帰を用いて回帰することで、前記被測定材料の成分を推定する推定部２３０と、を備えている。【選択図】図２</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230413&DB=EPODOC&CC=JP&NR=2023053725A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230413&DB=EPODOC&CC=JP&NR=2023053725A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHIRATORI HANAE</creatorcontrib><creatorcontrib>YANO MASAO</creatorcontrib><creatorcontrib>ITAKURA TOMOYA</creatorcontrib><title>ANALYZER, ANALYSIS METHOD, AND ANALYSIS PROGRAM</title><description>To provide an analyzer capable of improving analysis accuracy when analyzing the composition of a material to be measured based on spectral data.SOLUTION: An analyzer 20 includes: an acquisition unit 200 that acquires measurement data MD, which is spectral data of a material to be measured, and multiple reference data RD, which are the spectral data of the candidate components; a detection unit 210 that detects an index of the peak value on the acquired measurement data MD; a configuration unit 220 that reconfigures the measurement data MD based on the index of detected measurement data MD; and an estimation unit 230 that estimates the composition of the material under test by regressing using Lasso regression, which is the reconstructed measurement data MD of non-negative linear least squares.SELECTED DRAWING: Figure 2
【課題】スペクトルデータに基づいて被測定材料の成分を解析する場合において、解析精度の向上を図ること。【解決手段】解析装置２０は、被測定材料のスペクトルデータである測定データＭＤ、及び候補となる成分のスペクトルデータである複数の参照データＲＤを取得する取得部２００と、取得された測定データＭＤに対し、ピーク値のインデックスを検出する検出部２１０と、検出された測定データＭＤの前記インデックスに基づいて測定データＭＤを再構成する構成部２２０と、各参照データＲＤに対して再構成された測定データＭＤを非負の線形最小二乗法であるラッソ回帰を用いて回帰することで、前記被測定材料の成分を推定する推定部２３０と、を備えている。【選択図】図２</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB39HP0iYxyDdJRALOCPYMVfF1DPPxdQAIuCMGAIH_3IEdfHgbWtMSc4lReKM3NoOTmGuLsoZtakB-fWlyQmJyal1oS7xVgZGBkbGBqbG5k6mhMlCIAR1AmVg</recordid><startdate>20230413</startdate><enddate>20230413</enddate><creator>SHIRATORI HANAE</creator><creator>YANO MASAO</creator><creator>ITAKURA TOMOYA</creator><scope>EVB</scope></search><sort><creationdate>20230413</creationdate><title>ANALYZER, ANALYSIS METHOD, AND ANALYSIS PROGRAM</title><author>SHIRATORI HANAE ; YANO MASAO ; ITAKURA TOMOYA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2023053725A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHIRATORI HANAE</creatorcontrib><creatorcontrib>YANO MASAO</creatorcontrib><creatorcontrib>ITAKURA TOMOYA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHIRATORI HANAE</au><au>YANO MASAO</au><au>ITAKURA TOMOYA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ANALYZER, ANALYSIS METHOD, AND ANALYSIS PROGRAM</title><date>2023-04-13</date><risdate>2023</risdate><abstract>To provide an analyzer capable of improving analysis accuracy when analyzing the composition of a material to be measured based on spectral data.SOLUTION: An analyzer 20 includes: an acquisition unit 200 that acquires measurement data MD, which is spectral data of a material to be measured, and multiple reference data RD, which are the spectral data of the candidate components; a detection unit 210 that detects an index of the peak value on the acquired measurement data MD; a configuration unit 220 that reconfigures the measurement data MD based on the index of detected measurement data MD; and an estimation unit 230 that estimates the composition of the material under test by regressing using Lasso regression, which is the reconstructed measurement data MD of non-negative linear least squares.SELECTED DRAWING: Figure 2
【課題】スペクトルデータに基づいて被測定材料の成分を解析する場合において、解析精度の向上を図ること。【解決手段】解析装置２０は、被測定材料のスペクトルデータである測定データＭＤ、及び候補となる成分のスペクトルデータである複数の参照データＲＤを取得する取得部２００と、取得された測定データＭＤに対し、ピーク値のインデックスを検出する検出部２１０と、検出された測定データＭＤの前記インデックスに基づいて測定データＭＤを再構成する構成部２２０と、各参照データＲＤに対して再構成された測定データＭＤを非負の線形最小二乗法であるラッソ回帰を用いて回帰することで、前記被測定材料の成分を推定する推定部２３０と、を備えている。【選択図】図２</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | ANALYZER, ANALYSIS METHOD, AND ANALYSIS PROGRAM |
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