MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM

To allow change in three-dimensional warpage and curve to be grasped from image data.SOLUTION: A measurement apparatus according to an embodiment of the present invention has an acquiring unit, a measurement control unit, a storage unit, and a comparator unit. The acquiring unit acquires first objec...

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Bibliographische Detailangaben
Hauptverfasser: SEKI AKIHITO, SANO YUMA, NAKAMURA TOKUHIRO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To allow change in three-dimensional warpage and curve to be grasped from image data.SOLUTION: A measurement apparatus according to an embodiment of the present invention has an acquiring unit, a measurement control unit, a storage unit, and a comparator unit. The acquiring unit acquires first object image data including an object. The measurement control unit estimates a first three-dimensional position with respect to each of pixels of the first object image data and measures a first distortion degree indicating a degree of distortion of the object on the reference line, based on reference points defined on the first object image data, a reference line defined by setting the reference points as both ends thereof, and the first three-dimensional position. The storage unit stores a second distortion degree associated with the reference line. The comparator unit compares the first distortion degree and the second distortion degree to output comparison results.SELECTED DRAWING: Figure 1 【課題】画像データから三次元的な反りや曲がり方の変化をとらえられるようにする。【解決手段】実施形態の計測装置は、取得部と計測制御部と記憶部と比較部とを備える。取得部は、対象物を含む第1の対象画像データを取得する。計測制御部は、前記第1の対象画像データの画素ごとに第1の三次元位置を推定し、前記第1の対象画像データ上に定義される基準点と、前記基準点を両端として定義される基準線と、前記第1の三次元位置とから、前記基準線上の前記対象物のひずみの度合いを示す第1のひずみ度を計測する。記憶部は、前記基準線に対応付けられた第2のひずみ度を記憶する。比較部は、前記第1のひずみ度と前記第2のひずみ度とを比較し、比較結果を出力する。【選択図】図1