CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN

To provide a carboxylate and a carboxylic acid generator which can produce a resist pattern having excellent line edge roughness, and a resist composition comprising the same.SOLUTION: The present invention provides a carboxylate represented by the formula (I), a carboxylic acid generator and a resi...

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Hauptverfasser: ICHIKAWA KOJI, KOMURO KATSUHIRO, KATO SAKI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a carboxylate and a carboxylic acid generator which can produce a resist pattern having excellent line edge roughness, and a resist composition comprising the same.SOLUTION: The present invention provides a carboxylate represented by the formula (I), a carboxylic acid generator and a resist composition [where R4, R5, R7 and R8 each represent a halogen atom, a haloalkyl group or the like. A1 and A2 each denote a hydrocarbon group, the group optionally having a substituent, -CH2- in the group being optionally substituted with -O-, -CO-, -S- or -SO2-. X3 and X4 each represent -O- or -S-. m1 denotes 1-5, m2 and m8 each denote 0-5, m4 and m5 each denote 0-3, m7 denotes an integer of 0-4, 1≤m1+m7≤5, 0≤m2+m8≤5. X0 denotes an optionally substituted hydrocarbon group, -CH2- in the group being optionally substituted with -O-, -S-, -CO- or -SO2-].SELECTED DRAWING: None 【課題】良好なラインエッジラフネスを有するレジストパターンを製造できるカルボン酸塩、カルボン酸発生剤及びこれを含むレジスト組成物を提供することを目的とする。【解決手段】式(I)で表されるカルボン酸塩、カルボン酸発生剤及びレジスト組成物。TIFF2023035960000176.tif31163[式中、R4、R5、R7及びR8はそれぞれハロゲン原子、ハロアルキル基等を表す。A1及びA2はそれぞれ炭化水素基を表し、該基は置換基を有してもよく、該基中の-CH2-は、-O-、-CO-、-S-又は-SO2-で置き換わっていてもよい。X3及びX4はそれぞれ-O-又は-S-を表す。m1は1~5、m2、m8は0~5、m4、m5は0~3、m7は0~4の整数を表し、1≦m1+m7≦5、0≦m2+m8≦5である。X0は置換基を有してもよい炭化水素基を表し、該基中の-CH2-は、-O-、-S-、-CO-又は-SO2-に置き換わっていてもよい。]【選択図】なし