AUTOMATIC MEASUREMENT PROGRAM, AUTOMATIC MEASUREMENT DEVICE, AND AUTOMATIC MEASUREMENT METHOD BY ARBITRARY COORDINATES POINT GROUP

To provide an automatic measurement program, an automatic measurement device, and an automatic measurement method capable of easily and accurately measuring a dimension of a structure using a three-dimensional point group measured in an arbitrary coordinate system.SOLUTION: An automatic measurement...

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Hauptverfasser: NARA HISASHI, SATO MASAMICHI, KITAHARA TAKESHI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide an automatic measurement program, an automatic measurement device, and an automatic measurement method capable of easily and accurately measuring a dimension of a structure using a three-dimensional point group measured in an arbitrary coordinate system.SOLUTION: An automatic measurement program causes a computer to function as: a shape model registration unit 51 for registering a shape model; a three-dimensional point group acquisition unit 53 for acquiring a three-dimensional point group in the vicinity of a measurement target plane; a two-dimensional point group generation unit 55 for generating a two-dimensional point group in the vicinity of the measurement target plane from the three-dimensional point group; an approximate position specifying unit 56 for specifying an approximate position of the shape model; a detailed position specifying unit 57 for specifying a detailed position of the shape model; a peripheral line calculation unit 58 for calculating a peripheral line of the measurement target plane; and a measurement value calculation unit 59 for calculating a measurement value regarding the measurement target plane.SELECTED DRAWING: Figure 1 【課題】 任意の座標系で計測された3次元点群を用いて、構造物の寸法を簡単かつ高精度に計測することができる自動採寸プログラム、自動採寸装置および自動採寸方法を提供する。【解決手段】 形状モデルを登録する形状モデル登録部51と、採寸対象面近傍の3次元点群を取得する3次元点群取得部53と、3次元点群から採寸対象面近傍の2次元点群を生成する2次元点群生成部55と、形状モデルの概略位置を特定する概略位置特定部56と、形状モデルの詳細位置を特定する詳細位置特定部57と、採寸対象面の周囲線を算出する周囲線算出部58と、採寸対象面に関する採寸値を算出する採寸値算出部59としてコンピュータを機能させる。【選択図】 図1