OVERLAP DETERMINATION APPARATUS, OVERLAP DETERMINATION METHOD, AND PROGRAM

To provide a technology for accurately determining an overlap of objects, while improving a processing speed.SOLUTION: An overlap determination apparatus 10 for determining an overlap of a first target object and a second target object includes: a target object region generation unit 1 which generat...

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Hauptverfasser: SASAKI TOMONORI, UEMURA TAKAHIRO, SATOU KIYOMOTO, MIZUTANI HITONORI, MATSUTANI SEIICHIRO, TAJIMA YUICHIRO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a technology for accurately determining an overlap of objects, while improving a processing speed.SOLUTION: An overlap determination apparatus 10 for determining an overlap of a first target object and a second target object includes: a target object region generation unit 1 which generates, on the basis of image data obtained by an imaging apparatus 101 imaging the first target object and the second target object, a circular or elliptical first target object region corresponding to the first target object and a circular or elliptical second target object region corresponding to the second target object; a synthesized region generation unit 2 which synthesizes the first target object region with the second target object region to generate a synthesized region whose center is aligned with that of the first target object region; and an overlap determination unit 3 which determines that the first target object overlaps the second target object when the center of the second target object region is included in the synthesized region.SELECTED DRAWING: Figure 3 【課題】処理速度を向上させつつ、精度よく対象物体同士の重なりを判定する技術を提供する。【解決手段】第1対象物体と第2対象物体との重なりを判定する重なり判定装置10であって、撮像装置101で第1対象物体及び第2対象物体を撮像して得られる画像データに基づいて、第1対象物体に対応する円形状又は楕円形状の第1対象物体領域、及び、第2対象物体に対応する円形状又は楕円形状の第2対象物体領域を生成する対象物体領域生成部1と、第1対象物体領域と第2対象物体領域とを合成して、第1対象物体領域と中心を一致させた合成領域を生成する合成領域生成部2と、合成領域内に第2対象物体領域の中心が含まれている場合、第1対象物体と、第2対象物体とは重なっていると判定する重なり判定部3と、を備える。【選択図】図3