METHOD FOR EVALUATION, EVALUATION DEVICE, AND COMPUTER PROGRAM
To quantitatively evaluate a blister of a coating film.SOLUTION: The method for evaluating a blister of a coating film formed on an object includes the steps of: acquiring image data of the surface of a coating film irradiated with light by a coaxial lighting device, by an imaging device (step a); c...
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| creator | NAKATANI YASUTOSHI YAMAGATA HIDETO YAMAZAKI KEIKO HONDA YUKARI |
| description | To quantitatively evaluate a blister of a coating film.SOLUTION: The method for evaluating a blister of a coating film formed on an object includes the steps of: acquiring image data of the surface of a coating film irradiated with light by a coaxial lighting device, by an imaging device (step a); conducting at least binarization processing on the image data and detecting a region of a blister in the surface of the coating film (step b); and determining the area rate of the region of the blister in the region of the evaluation target of the image data (step c).SELECTED DRAWING: Figure 1
【課題】塗膜のブリスターを定量的に評価する。【解決手段】物体上に形成された塗膜のブリスターを評価する評価方法が、（ａ）同軸照明装置で光照射された塗膜の表面の画像データを撮影装置によって取得し、（ｂ）画像データに少なくとも二値化処理を施して、塗膜の表面に存在するブリスターの領域を検出し、および（ｃ）画像データの評価対象の領域においてブリスターの領域が占める面積率を求めることを含む。【選択図】図１ |
| format | Patent |
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【課題】塗膜のブリスターを定量的に評価する。【解決手段】物体上に形成された塗膜のブリスターを評価する評価方法が、（ａ）同軸照明装置で光照射された塗膜の表面の画像データを撮影装置によって取得し、（ｂ）画像データに少なくとも二値化処理を施して、塗膜の表面に存在するブリスターの領域を検出し、および（ｃ）画像データの評価対象の領域においてブリスターの領域が占める面積率を求めることを含む。【選択図】図１</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221215&DB=EPODOC&CC=JP&NR=2022186406A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221215&DB=EPODOC&CC=JP&NR=2022186406A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAKATANI YASUTOSHI</creatorcontrib><creatorcontrib>YAMAGATA HIDETO</creatorcontrib><creatorcontrib>YAMAZAKI KEIKO</creatorcontrib><creatorcontrib>HONDA YUKARI</creatorcontrib><title>METHOD FOR EVALUATION, EVALUATION DEVICE, AND COMPUTER PROGRAM</title><description>To quantitatively evaluate a blister of a coating film.SOLUTION: The method for evaluating a blister of a coating film formed on an object includes the steps of: acquiring image data of the surface of a coating film irradiated with light by a coaxial lighting device, by an imaging device (step a); conducting at least binarization processing on the image data and detecting a region of a blister in the surface of the coating film (step b); and determining the area rate of the region of the blister in the region of the evaluation target of the image data (step c).SELECTED DRAWING: Figure 1
【課題】塗膜のブリスターを定量的に評価する。【解決手段】物体上に形成された塗膜のブリスターを評価する評価方法が、（ａ）同軸照明装置で光照射された塗膜の表面の画像データを撮影装置によって取得し、（ｂ）画像データに少なくとも二値化処理を施して、塗膜の表面に存在するブリスターの領域を検出し、および（ｃ）画像データの評価対象の領域においてブリスターの領域が占める面積率を求めることを含む。【選択図】図１</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDzdQ3x8HdRcPMPUnANc_QJdQzx9PfTQWIruLiGeTq76ig4-rkoOPv7BoSGuAYpBAT5uwc5-vIwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDIyNDCzMTAzNHY6IUAQCdjCpx</recordid><startdate>20221215</startdate><enddate>20221215</enddate><creator>NAKATANI YASUTOSHI</creator><creator>YAMAGATA HIDETO</creator><creator>YAMAZAKI KEIKO</creator><creator>HONDA YUKARI</creator><scope>EVB</scope></search><sort><creationdate>20221215</creationdate><title>METHOD FOR EVALUATION, EVALUATION DEVICE, AND COMPUTER PROGRAM</title><author>NAKATANI YASUTOSHI ; YAMAGATA HIDETO ; YAMAZAKI KEIKO ; HONDA YUKARI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2022186406A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKATANI YASUTOSHI</creatorcontrib><creatorcontrib>YAMAGATA HIDETO</creatorcontrib><creatorcontrib>YAMAZAKI KEIKO</creatorcontrib><creatorcontrib>HONDA YUKARI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKATANI YASUTOSHI</au><au>YAMAGATA HIDETO</au><au>YAMAZAKI KEIKO</au><au>HONDA YUKARI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR EVALUATION, EVALUATION DEVICE, AND COMPUTER PROGRAM</title><date>2022-12-15</date><risdate>2022</risdate><abstract>To quantitatively evaluate a blister of a coating film.SOLUTION: The method for evaluating a blister of a coating film formed on an object includes the steps of: acquiring image data of the surface of a coating film irradiated with light by a coaxial lighting device, by an imaging device (step a); conducting at least binarization processing on the image data and detecting a region of a blister in the surface of the coating film (step b); and determining the area rate of the region of the blister in the region of the evaluation target of the image data (step c).SELECTED DRAWING: Figure 1
【課題】塗膜のブリスターを定量的に評価する。【解決手段】物体上に形成された塗膜のブリスターを評価する評価方法が、（ａ）同軸照明装置で光照射された塗膜の表面の画像データを撮影装置によって取得し、（ｂ）画像データに少なくとも二値化処理を施して、塗膜の表面に存在するブリスターの領域を検出し、および（ｃ）画像データの評価対象の領域においてブリスターの領域が占める面積率を求めることを含む。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | METHOD FOR EVALUATION, EVALUATION DEVICE, AND COMPUTER PROGRAM |
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