METHOD FOR EVALUATION, EVALUATION DEVICE, AND COMPUTER PROGRAM

To quantitatively evaluate a blister of a coating film.SOLUTION: The method for evaluating a blister of a coating film formed on an object includes the steps of: acquiring image data of the surface of a coating film irradiated with light by a coaxial lighting device, by an imaging device (step a); c...

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Bibliographische Detailangaben
Hauptverfasser:	NAKATANI YASUTOSHI, YAMAGATA HIDETO, YAMAZAKI KEIKO, HONDA YUKARI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Zusammenfassung:	To quantitatively evaluate a blister of a coating film.SOLUTION: The method for evaluating a blister of a coating film formed on an object includes the steps of: acquiring image data of the surface of a coating film irradiated with light by a coaxial lighting device, by an imaging device (step a); conducting at least binarization processing on the image data and detecting a region of a blister in the surface of the coating film (step b); and determining the area rate of the region of the blister in the region of the evaluation target of the image data (step c).SELECTED DRAWING: Figure 1 【課題】塗膜のブリスターを定量的に評価する。【解決手段】物体上に形成された塗膜のブリスターを評価する評価方法が、（ａ）同軸照明装置で光照射された塗膜の表面の画像データを撮影装置によって取得し、（ｂ）画像データに少なくとも二値化処理を施して、塗膜の表面に存在するブリスターの領域を検出し、および（ｃ）画像データの評価対象の領域においてブリスターの領域が占める面積率を求めることを含む。【選択図】図１