REFLECTION TYPE ENCODER SCALE AND ENCODER SCALE UNIT

To obtain a reflection type encoder scale that is easy to manufacture and shows highly accurate pattern width accuracy.SOLUTION: A reflection type encoder scale has a low reflection unit formed by plating processing using a mask 70 having: a resist pattern unit 72 including a plurality of linear uni...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	ARAKI SHINJI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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