MATERIAL EVALUATION METHOD

To provide a material evaluation method which allows for objectively identifying microstructures of a material.SOLUTION: A material evaluation method is provided, comprising acquiring an image of a cross-section of a material, dividing the acquired image into multiple sections, measuring brightness...

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1. Verfasser:	HOSONO URETAKE
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRICITY INDUCTANCES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MAGNETS MEASURING PHYSICS SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES TESTING TRANSFORMERS
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Beschreibung
Zusammenfassung:	To provide a material evaluation method which allows for objectively identifying microstructures of a material.SOLUTION: A material evaluation method is provided, comprising acquiring an image of a cross-section of a material, dividing the acquired image into multiple sections, measuring brightness of a plurality of pixels in each section, obtaining a brightens histogram of each section from brightens of each pixel, and identifying a microstructure of each section from the brightness histogram of each section.SELECTED DRAWING: Figure 9 【課題】客観的に材料の微細構造を特定できる評価方法を提供する。【解決手段】材料の断面の画像を得る工程と、得られた画像を複数の区画に分割する工程と、各区画に含まれる複数の画素の輝度を測定する工程と、各画素の輝度から各区画の輝度ヒストグラムを得る工程と、各区画の輝度ヒストグラムから各区画の微細構造を特定する工程と、を有する材料の評価方法である。【選択図】図９