PROCESSING STATE ESTIMATION METHOD AND PROCESSING STATE ESTIMATION SYSTEM

To provide a processing state estimation method and a processing state estimation system that can accurately estimate a processing state of a workpiece.SOLUTION: A processing state estimation system 1 includes an observation device 20 and an estimation arithmetic device 30. The estimation arithmetic...

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Hauptverfasser: OHANA TSUGUYORI, MANO DAIKI, HAMADA KENJI, IWAI HIDEKI, WAKAZONO YOSHIO, KON TOMOHIKO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a processing state estimation method and a processing state estimation system that can accurately estimate a processing state of a workpiece.SOLUTION: A processing state estimation system 1 includes an observation device 20 and an estimation arithmetic device 30. The estimation arithmetic device 30 includes: a signal acquisition unit 31 for acquiring an AE signal S from the observation device 20; a total effective value arithmetic unit 32 for calculating a total effective value J1 of the AE signal S; a frequency region effective value arithmetic unit 33 for calculating an effective value J2 of a partial frequency region of the AE signal S; and a ratio arithmetic unit 34 for calculating a ratio K being interrelated with a processing state, using scaling by dividing the effective value J2 by the effective value J1. The processing state estimation system estimates a processing state that is interrelated with the ratio calculated by the ratio arithmetic unit 34.SELECTED DRAWING: Figure 4 【課題】工作物の加工状態を精度良く推定することができる加工状態推定方法及び加工状態推定システムを提供すること。【解決手段】加工状態推定システム1は、観測装置20及び推定演算装置30を備える。推定演算装置30は、観測装置20からAE信号Sを取得する信号取得部31と、AE信号Sの全体の実効値J1を算出する全体実効値演算部32と、AE信号Sの一部の周波数領域の実効値J2を算出する周波数領域実効値演算部33と、実効値J2を実効値J1で除することにより基準化して、加工状態と相関関係にある比率Kを算出する比率演算部34と、を有して、比率演算部34によって算出された比率と相関関係にある加工状態を推定する。【選択図】図4