INSPECTION SYSTEM AND INSPECTION METHOD

To provide an inspection system and an inspection method for shortening the time required for the inspection of environmental microorganisms.SOLUTION: An inspection system comprises: an imaging unit which directly images samples taken from an indoor environment; and an output unit which inspects env...

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Bibliographische Detailangaben
Hauptverfasser: KAWAI SHOGO, GOTO AOI, NAMIKAWA TAKASHI, OTO RYUICHIRO, MAEDA SHOTARO, YOSHIMURA NAOMI, WATABE SHIHO, TAKANO WAKANA, KANETAKE MIREI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide an inspection system and an inspection method for shortening the time required for the inspection of environmental microorganisms.SOLUTION: An inspection system comprises: an imaging unit which directly images samples taken from an indoor environment; and an output unit which inspects environmental microorganisms in image data taken by the imaging unit and outputs inspection results.SELECTED DRAWING: Figure 1 【課題】環境微生物の検査に要する時間を短縮する検査システム及び検査方法を提供する。【解決手段】検査システムは、室内環境から採取された試料を直接撮影する撮像部と、前記撮像部により撮影された画像データ内の環境微生物を検査し検査結果を出力する出力部とを有する。【選択図】図1