INSPECTION SYSTEM AND INSPECTION METHOD

To provide an inspection system and an inspection method for shortening the time required for the inspection of environmental microorganisms.SOLUTION: An inspection system inspects microorganisms or mold occurring in an indoor environment or a device and comprises: an imaging unit which directly ima...

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Bibliographische Detailangaben
Hauptverfasser: KAWAI SHOGO, GOTO AOI, NAMIKAWA TAKASHI, OTO RYUICHIRO, MAEDA SHOTARO, YOSHIMURA NAOMI, WATABE SHIHO, TAKANO WAKANA, KANETAKE MIREI
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:To provide an inspection system and an inspection method for shortening the time required for the inspection of environmental microorganisms.SOLUTION: An inspection system inspects microorganisms or mold occurring in an indoor environment or a device and comprises: an imaging unit which directly images samples taken from the indoor environment or the device; and an output unit which inspects microorganisms or mold in image data taken by the imaging unit and outputs inspection results.SELECTED DRAWING: Figure 1 【課題】環境微生物の検査に要する時間を短縮する検査システム及び検査方法を提供する。【解決手段】室内環境もしくは機器に発生する微生物またはカビを検査する検査システムであって、室内環境もしくは機器から採取された試料を直接撮影する撮像部と、前記撮像部により撮影された画像データ内の微生物またはカビを検査し検査結果を出力する出力部とを有する。【選択図】図1