MEASUREMENT DEVICE, MEASUREMENT METHOD AND PROGRAM THEREFOR

To provide a new measuring device, measuring method, and program therefor that are able to quantitatively measure a size and a shape in a circumferential direction.SOLUTION: A measurement device 20, which measures an outer peripheral surface of a to-be-measured object 11, includes: an emitting unit...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TOYODA CHIE, MORIMOTO RYOHEI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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