MEASUREMENT DEVICE, MEASUREMENT METHOD AND PROGRAM THEREFOR

To provide a new measuring device, measuring method, and program therefor that are able to quantitatively measure a size and a shape in a circumferential direction.SOLUTION: A measurement device 20, which measures an outer peripheral surface of a to-be-measured object 11, includes: an emitting unit...

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Bibliographische Detailangaben
Hauptverfasser: TOYODA CHIE, MORIMOTO RYOHEI
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:To provide a new measuring device, measuring method, and program therefor that are able to quantitatively measure a size and a shape in a circumferential direction.SOLUTION: A measurement device 20, which measures an outer peripheral surface of a to-be-measured object 11, includes: an emitting unit 21 by which slit light is emitted to a plurality of measurement surfaces of the to-be-measured object from a plurality of directions by one or more branches so as to intersect the plurality of measurement surfaces and have a first inclination angle; and an imaging unit 26 that has a second inclination angle with respect to an optical axis of the emitting unit and captures an image including reflected light of the slit light emitted to the plurality of measurement surfaces.SELECTED DRAWING: Figure 1 【課題】周方向の大きさおよび形状を定量的に計測することができる新規な計測装置、計測方法及びそのプログラムを提供する。【解決手段】計測装置20は、測定対象物11の外周表面を計測する計測装置であって、1以上の分岐により複数の方向から測定対象物の複数の測定面に対してスリット光を、この複数の測定面に交差し且つ第1の傾斜角を有して照射する照射部21と、照射部の光軸に対して第2の傾斜角を有し複数の測定面に対して照射されたスリット光の反射光を含む画像を撮像する撮像部26と、を備える。【選択図】図1