METHOD, SYSTEM, COMPUTER PROGRAM AND COMPUTER-READABLE STORAGE MEDIUM FOR DIAGNOSING FAULTY CIRCUIT ELEMENTS

To diagnose faulty circuit elements using built-in self-test circuits.SOLUTION: A method includes executing a test for a first structure and a second structure of a built-in self-test circuit. Each of the first and second structures includes a plurality of latches arranged as a plurality of stump ch...

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Bibliographische Detailangaben

Hauptverfasser:	GERARD MICHAEL SALEM, STEVEN MICHAEL DOUSKEY, FRANCO MOTIKA, ORAZIO PASQUALE FORLENZA, MARY P KUSKO
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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