STATE MONITORING DEVICE AND STATE MONITORING METHOD

To provide a state monitoring device capable of diagnosing abnormality in an object at low measurement costs even if an S/N ratio of signals acquired from a sensor installed in the object is low.SOLUTION: A state monitoring device 80 includes: a correction part 83 for generating a corrected signal b...

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1. Verfasser: HATAYAMA WATARU
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a state monitoring device capable of diagnosing abnormality in an object at low measurement costs even if an S/N ratio of signals acquired from a sensor installed in the object is low.SOLUTION: A state monitoring device 80 includes: a correction part 83 for generating a corrected signal by multiplying strength of a sensor signal acquired from a sensor 70 during a diagnosis period by a correction coefficient corresponding to the strength; and a diagnosis part 84 for diagnosing abnormality in an object on the basis of time waveform of the corrected signal. When an expectation value of strength distribution of a sensor signal acquired from the sensor 70 during a diagnosis period is set to μ and strength of a sensor signal is set to xraw, a correction coefficient satisfies a first condition and a second condition. The first condition is a condition in which a correction coefficient becomes larger as (xraw-μ) becomes larger when μxraw is satisfied.SELECTED DRAWING: Figure 3 【課題】対象物に設置されたセンサから取得される信号のS/N比が低い場合であっても、低い計測コストで対象物の異常を診断できる状態監視装置を提供する。【解決手段】状態監視装置80は、診断期間においてセンサ70から取得したセンサ信号の強度に、当該強度に応じた補正係数を乗算することにより補正済信号を生成する補正部83と、補正済信号の時間波形に基づいて、対象物の異常を診断する診断部84とを備える。診断期間においてセンサ70から取得されたセンサ信号の強度分布の期待値をμとし、センサ信号の強度をxrawとすると、補正係数は、第1条件および第2条件を満たす。第1条件は、μ<xrawのときに(xraw-μ)が大きくなるほど補正係数が大きくなる条件である。第2条件は、μ>xrawのときに(μ-xraw)が大きくなるほど補正係数が大きくなるという条件である。【選択図】図3