SEMICONDUCTOR STORAGE DEVICE

To improve the yield of a semiconductor storage device.SOLUTION: A semiconductor storage device according to an embodiment includes a substrate 20, a source line SL, a plurality of word lines WL, a pillar MP, an outer peripheral conductive layer 62, a lower conductive layer 73, and a first contact C...

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Bibliographische Detailangaben
Hauptverfasser: IWASAKI TAICHI, MATSUMOTO SOTA, WATARAI AYUMI, MATSUURA OSATAKE, HIROTSU YU
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To improve the yield of a semiconductor storage device.SOLUTION: A semiconductor storage device according to an embodiment includes a substrate 20, a source line SL, a plurality of word lines WL, a pillar MP, an outer peripheral conductive layer 62, a lower conductive layer 73, and a first contact C3L. The source line SL is provided over the substrate 20 in a core region MA. The pillar MP has its bottom reaching the source line SL, and intersection parts with the word lines WL each function as a memory cell. The outer peripheral conductive layer 62 is included in a first layer including the source line SL in a first region WR and is provided to surround the core region MA. The lower conductive layer 73 is included in a second layer D2 in the first region WR. The first contact C3L is provided on the lower conductive layer 73 so as to surround the core region MA in the first region WR, has an upper end included in the first layer, and is electrically connected to the outer peripheral conductive layer 62.SELECTED DRAWING: Figure 11 【課題】半導体記憶装置の歩留まりを向上させる。【解決手段】実施形態の半導体記憶装置は、基板20と、ソース線SLと、複数のワード線WLと、ピラーMPと、外周導電体層62と、下層導電体層73と、第1コンタクトC3Lとを含む。ソース線SLは、コア領域MAで、基板20の上方に設けられる。ピラーMPは、底部がソース線SLに達し、複数のワード線WLとの交差部分がそれぞれメモリセルとして機能する。外周導電体層62は、第1領域WRで、ソース線SLを含む第1層に含まれ、且つコア領域MAを囲むように設けられる。下層導電体層73は、第1領域WRで、第2層D2に含まれる。第1コンタクトC3Lは、第1領域WRで、コア領域MAを囲むように下層導電体層73の上に設けられ、上端が第1層に含まれ、外周導電体層62と電気的に接続される。【選択図】図11