MEASUREMENT SYSTEM AND MEASUREMENT METHOD

To provide a measurement system and a measurement method that are capable of easily measuring the intensity distribution of diffracted X-rays in a desired arrangement.SOLUTION: A measurement system 1, which has a shaft 2 and a flange 3 radially projecting from the shaft and can measure the intensity...

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Bibliographische Detailangaben
Hauptverfasser: ADACHI HITOMI, YAKURA RYOTA, KABUTOMORI TATSUHIKO, MATSUDA MARIKO
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:To provide a measurement system and a measurement method that are capable of easily measuring the intensity distribution of diffracted X-rays in a desired arrangement.SOLUTION: A measurement system 1, which has a shaft 2 and a flange 3 radially projecting from the shaft and can measure the intensity distribution of diffracted X-rays obtained by irradiating, with X-rays, a fillet part 4 of a metallic structure having the fillet part at a connection between the shaft and the flange, comprises: a diffracted X-ray measurement device 10 including an irradiation part for irradiating the fillet part with X-rays; and a positioning device 20 for positioning the diffracted X-ray measurement device relative to the fillet part. The positioning device includes: a movement mechanism for moving the diffracted X-ray measurement device three-dimensionally and relative to the fillet part; and a rotation mechanism for rotating the diffracted X-ray measurement device in a direction in which an incident angle of the X-rays with respect to the fillet part changes.SELECTED DRAWING: Figure 1 【課題】回折X線の強度分布を所望の配置で容易に測定することが可能な測定システム及び測定方法を提供する。【解決手段】軸部2とこの軸部から径方向に突出するフランジ部3とを有し、軸部とフランジ部との接続部分にフィレット部4を有する金属構造物のフィレット部にX線を照射して得られる回折X線の強度分布を測定可能な測定システム1であって、X線をフィレット部に照射する照射部を有する回折X線測定装置10と、フィレット部に対して回折X線測定装置を位置決めする位置決め装置20とを備え、位置決め装置が、回折X線測定装置をフィレット部に対して三次元で相対移動させる移動機構と、フィレット部に対するX線の入射角度が変化する方向に回折X線測定装置を回転させる回転機構とを有する。【選択図】図1