MOUNTING JIG AND X-RAY DIFFRACTION METHOD USING THE SAME

To improve the measurement efficiency in X-ray diffraction measurement.SOLUTION: A mounting jig for mounting a capillary holder on a sample attachment part of an X-ray diffraction device comprises a main body, a mounting part provided on one end of the main body and on which the capillary holder is...

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1. Verfasser:	ONO KATSUSHI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	To improve the measurement efficiency in X-ray diffraction measurement.SOLUTION: A mounting jig for mounting a capillary holder on a sample attachment part of an X-ray diffraction device comprises a main body, a mounting part provided on one end of the main body and on which the capillary holder is mounted, and a magnet provided on the other end of the main body. The mounting jig is supported and fixed by the magnet with respect to the sample attachment part.SELECTED DRAWING: Figure 1 【課題】Ｘ線回折測定の測定効率を向上させる。【解決手段】Ｘ線回折装置の試料装着部にキャピラリホルダを取り付けるためのマウント治具であって、本体部と、本体部の一端に設けられ、キャピラリホルダを取り付けるための取付部と、本体部の他端に設けられる磁石と、を備え、試料装着部に対して磁石で支持固定される、マウント治具である。【選択図】図１