IMAGE INSPECTION APPARATUS, IMAGE INSPECTION METHOD, AND PROGRAM

To provide an image inspection apparatus, an image inspection method, and a program which inspect a target image for inspection.SOLUTION: An image inspection apparatus 1 includes a feature amount extracting unit 11 for extracting a first feature amount from an image, a dimension reducing unit 12 for calculating a second feature amount by reducing a dimension of the first feature amount of an inspection image in which an inspection target 100 is captured, and an abnormality degree calculating unit 13 for calculating abnormality degree of the inspection image based on the second feature amount to thereby determine whether or not the inspection image is abnormal. The dimension reducing unit 12 calculates the second feature amount by reducing the dimension of the first feature amount by using a learning unit derived based on first feature amounts of a plurality of teacher images individually associated with a normal label or an abnormal label, and the normal label or the abnormal label.SELECTED DRAWING: Figure 1 【課題】検査対象の画像を検査する画像検査装置、画像検査方法及びプログラムを提供する。【解決手段】画像検査装置１は、画像から第１特徴量を抽出する特徴量抽出部１１と、検査対象物１００が映された検査画像の第１特徴量を次元削減して第２特徴量を算出する次元削減部１２と、第２特徴量に基づいて検査画像の異常度を算出し、検査画像が異常であるか否かを判定する異常度算出部１３とを備える。次元削減部１２は、正常ラベル又は異常ラベルが個別に関連付けられた、複数の教師画像の第１特徴量と、正常ラベル又は異常ラベルとに基づいて導出された学習器とを用いて、第１特徴量を次元削減して第２特徴量を算出する。【選択図】図１