SiC SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD OF SiC SEMICONDUCTOR DEVICE

To provide an SiC semiconductor device that prevents protrusion of solder from an electrode pad and a manufacturing method of the same.SOLUTION: A semiconductor device 100 includes an SiC substrate 50 in which a diffusion layer 60 is formed on one main surface and an annular substrate uneven section...

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Hauptverfasser: KANEKO YUICHI, HARAGUCHI MASAHIRO, FURUTA KENICHI, KUROKI HIROKI, TERADA NOBUHIRO, INOUE TAKESHI, TSUJIMOTO MASAO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide an SiC semiconductor device that prevents protrusion of solder from an electrode pad and a manufacturing method of the same.SOLUTION: A semiconductor device 100 includes an SiC substrate 50 in which a diffusion layer 60 is formed on one main surface and an annular substrate uneven section 51 is pattern formed so as to surround the diffusion layer 60, an electrode film 70 which is formed to cover the diffusion layer 60 and the annular substrate uneven section 51 and in which a guard ring 71 having an annular uneven section is formed in at least a part containing an outer edge, and a protection film 80 which is formed to expose at least a part of the guard ring 71.SELECTED DRAWING: Figure 2 【課題】電極パッド上からはんだがはみ出すことを防ぐSiC半導体装置及びその製造方法を提供する。【解決手段】半導体装置100において、一主面に拡散層60が形成されており、当該拡散層60を取り囲むように環状の基板凹凸部51がパターン形成されたSiC基板50と、拡散層60及び環状の基板凹凸部51を覆うように形成され、外縁を含む少なくとも一部に環状の凹凸部を有するガードリング71が形成されている電極膜70と、ガードリング71の少なくとも1部が露出するように形成された保護膜80と、を有する。【選択図】図2