METHOD AND SYSTEM FOR DETECTION OF IMPURITIES IN ADDITIVE MANUFACTURING MATERIALS

To provide a method and system for detecting impurities in an additive manufacturing material.SOLUTION: An exemplary method for detecting impurities in an additive manufacturing material includes illuminating a sample of the additive manufacturing material with light by a light source, causing a cam...

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Hauptverfasser: ERIC M CHAPMAN, ROBERT W GRUBE, BRIANNA K NORD, ALEXANDER J COCO, EMMA ROMIG, AARON C DROLLETTE
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a method and system for detecting impurities in an additive manufacturing material.SOLUTION: An exemplary method for detecting impurities in an additive manufacturing material includes illuminating a sample of the additive manufacturing material with light by a light source, causing a camera to acquire an image of the sample while illuminating the sample of the additive manufacturing material with light, and processing the image data to identify an amount of impurities in the sample of the additive manufacturing material. An exemplary system for detecting impurities in an additive manufacturing material includes a light source for illuminating a sample of the additive manufacturing material with light, a camera for acquiring image data of the sample while illuminating the sample of the additive manufacturing material with light, and a computing device having one or more processors configured to execute instructional instructions stored in the memory, for processing the image data to identify an amount of impurities in the sample of the additive manufacturing material.SELECTED DRAWING: Figure 1 【課題】積層造形材料内の不純物の検出のための方法及びシステムを提供する。【解決手段】積層造形材料内の不純物の検出のための例示的な方法が、光源によって積層造形材料のサンプルを光で照らすこと、積層造形材料のサンプルを光で照らしながら、カメラにサンプルの画像を取得させること、及び、画像データを処理して、積層造形材料のサンプル内の不純物の量を特定することを含む。積層造形材料内の不純物の検出のための例示的なシステムが、積層造形材料のサンプルを光で照らすための光源、積層造形材料のサンプルを光で照らしながら、サンプルの画像データを取得するカメラ、及び、画像データを処理して、積層造形材料のサンプル内の不純物の量を特定するための、メモリ内に記憶された指示命令を実行するように構成された1以上のプロセッサを有する計算デバイスを含む。【選択図】図1