EDDY CURRENT FLAW INSPECTION METHOD AND EDDY CURRENT FLAW INSPECTION DEVICE
To provide an eddy current flaw inspection method and an eddy current flaw inspection device that can determine a flaw on a surface of an object of inspection with high precision even when the object of inspection is displaced relative to a flaw inspection probe.SOLUTION: An eddy current flaw inspec...
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| Format: | Patent |
| Sprache: | eng ; jpn |
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| Zusammenfassung: | To provide an eddy current flaw inspection method and an eddy current flaw inspection device that can determine a flaw on a surface of an object of inspection with high precision even when the object of inspection is displaced relative to a flaw inspection probe.SOLUTION: An eddy current flaw inspection method includes: a differential signal generation process of performing differential processing on respective lift-off signals of a comparison sample and an object of inspection to generate a differential signal; a determination process of determining whether the differential signal includes a component outside a threshold range; a blanking signal generation process of generating a blanking signal blanking the component outside the threshold range; and a blanking process of blanking ranges of the lift-off signals corresponding to the component outside the threshold range with the blanking signal.SELECTED DRAWING: Figure 4
【課題】探傷プローブに対して検査対象物を変位させる場合であっても、検査対象物の表面上のきずを高精度に判別することができる渦電流探傷検査方法及び渦電流探傷検査装置を提供すること。【解決手段】比較見本及び検査対象物のそれぞれのリフトオフ信号を微分処理して微分信号を生成する微分信号生成工程と、前記微分信号に閾値範囲外の成分が含まれているか否を判定する判定工程と、前記閾値範囲外の成分をブランキングするブランキング信号を生成するブランキング信号生成工程と、前記リフトオフ信号における前記閾値範囲外の成分に対応する範囲を前記ブランキング信号によってブランキングするブランキング工程と、を有すること。【選択図】図４ |
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