METHOD FOR DETERMINING QUALITY OF COATING FILM, METHOD FOR DETERMINING QUALITY OF INSULATING LAYER, METHOD OF MANUFACTURING BASE MATERIAL HAVING COATING FILM, AND SOLAR CELL HAVING INSULATING LAYER

To provide a method for determining the quality of a coating film capable of confirming the location of a coating defect of the coating film during a manufacturing process.SOLUTION: Disclosed is a coating quality determination method which determines the quality of a coating film formed on a base material. The coating film is formed in at least a part of the base material. This device includes: a color change step S1 of discoloring the exposed portion of the base material by exposing the base material under an oxidation condition or sulfurization condition; an image processing step S2 of photographing the surface of the base material to perform image processing; and a determination step S3 of determining the quality of the coating film based on the result of the image processing.SELECTED DRAWING: Figure 4 【課題】製造プロセス中に、被膜の被膜不良の箇所を確認できる被膜良否判定方法を提供する。【解決手段】被膜良否判定方法は、基材に形成される被膜の良否判定を行う方法であって、基材における少なくとも一部には、被膜が形成されており、基材を酸化条件下または硫化条件下にさらし、基材の露出部分を変色させる変色工程Ｓ１と、基材の表面を撮影して画像処理を行う画像処理工程Ｓ２と、画像処理の結果に基づいて、被膜の良否判定を行う判定工程Ｓ３と、を備える。【選択図】図４