SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING SYSTEM
To surely lock a lid part to a container main body while preventing dust emission due to rubbing of a member from contaminating a substrate in a substrate processing apparatus that processes the substrate in a processing container.SOLUTION: A substrate processing system 1 comprises: a processing con...
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Format: | Patent |
Sprache: | eng ; jpn |
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Zusammenfassung: | To surely lock a lid part to a container main body while preventing dust emission due to rubbing of a member from contaminating a substrate in a substrate processing apparatus that processes the substrate in a processing container.SOLUTION: A substrate processing system 1 comprises: a processing container main body 12; a lid part 13 which can close its opening; a movement part 14 which opens and closes the opening by mutually moving the lid part to the processing container main body; and a lock mechanism 16 that locks the lid part to the processing container main body. A lock mechanism includes: an arm part 161 which is extended toward the other side on one side of the processing container main body and the lid part, and is extended to the other side so as to exceed a gap space from the processing container main body when the lid part is at a separation position separated from the processing container main body; and an engagement part 162 that regulates a deviation of the arm part by being engaged to a portion positioned at a position exceeding the gap space when the lid part of the arm part is positioned at the separation position.SELECTED DRAWING: Figure 1
【課題】処理容器内で基板を処理する基板処理装置において、部材の摺擦による発塵が基板を汚染するのを防止しつつ、容器本体に対し蓋部を確実にロックする。【解決手段】基板処理システム1は、処理容器本体12と、その開口を閉塞可能な蓋部13と、処理容器本体に対し蓋部を相対移動させて開口を開閉する移動部14と、処理容器本体に対して蓋部をロックするロック機構16とを備えている。ロック機構は、処理容器本体および蓋部のうち一方側に他方側に向けて延設され、かつ、蓋部が処理容器本体から離間する離間位置にあるときには処理容器本体との間隙空間を超えて他方側まで延びるアーム部161と、アーム部のうち蓋部が離間位置にあるときに間隙空間を超えた位置にある部位に係合して、アーム部の変位を規制する係止部162とを有している。【選択図】図1 |
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