ASSEMBLY METHOD FOR PROBER AND TEACHING JIG

To provide an assembly method for a prober which can be easily assembled with securing accuracy in adjusting a delivery position, and a teaching jig.SOLUTION: An assembly method for a prober includes the steps of: in a prober (10) comprising a measurement unit (12) and a loader part (14), docking bo...

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Bibliographische Detailangaben
1. Verfasser:	TAMURA TAKUO
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
Online-Zugang:	Volltext bestellen
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