SiC MATERIAL AND SiC COMPOSITE MATERIAL
To provide an SiC material and an SiC composite material which are stably and evenly etched in a plasma environment.SOLUTION: In the SiC material and the SiC composite material, a diffraction intensity ratio (I) of an X-ray diffraction peak calculated by formula (1) defined by [diffraction intensity...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng ; jpn |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | To provide an SiC material and an SiC composite material which are stably and evenly etched in a plasma environment.SOLUTION: In the SiC material and the SiC composite material, a diffraction intensity ratio (I) of an X-ray diffraction peak calculated by formula (1) defined by [diffraction intensity ratio (I)]={[peak intensity of plane (200)]+[peak intensity of plane (220)]}/[peak intensity of plane (111)] is less than 1.5.SELECTED DRAWING: Figure 1C
【課題】プラズマ環境で安定的で均一にエッチングされるSiC素材及びSiC複合素材の提供。【解決手段】下記の式(1)により算出されるX−回折ピークの回折強度比(I)が1.5未満であるSiC素材及びSiC複合素材を開示する。【選択図】図1C |
---|