INSPECTION DEVICE

To provide an inspection device capable of determining the quality of an object to be inspected at a high speed.SOLUTION: An inspection device includes: an image generation section 22 that expands a one-dimensional transmission signal of an object to be inspected, which passes over an irradiation line of electromagnetic waves, to a two-dimensional image in memory; an image processing section 23 that performs image processing for a partial image each time the partial image including a part of the object to be inspected is generated in the image generation section; and an inspection section 24 that inspects the quality of the partial image after image processing on the basis of processing results of one or more processing times of the image processing section.SELECTED DRAWING: Figure 3 【課題】被検査物の品質を高速で判定可能な検査装置を提供する。【解決手段】検査装置は、電磁波の照射ライン上を通過する被検査物の一次元の透過信号を、メモリ上で二次元の画像に展開する画像生成部２２と、画像生成部において被検査物の一部分を含む部分画像が生成される度に、当該部分画像を対象として画像処理を行う画像処理部２３と、画像処理部の一または複数回の処理結果に基づいて、画像処理後の部分画像の品質を検査する検査部２４と、を備える。【選択図】図３