SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND ELECTRONIC SYSTEM

To provide a technique that can wirelessly send accumulated heat stress information while reducing the power consumption.SOLUTION: The semiconductor device includes: a holding circuit having a buffer for measuring heat stress information with an obvious temperature dependence at every specific inter...

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Hauptverfasser: SHIMADA MASAKI, TSUCHIYA FUMIO, TAKAZAWA YOSHIO, OTA NAOYA, OSHIDA DAISUKE, KONISHI SHINYA, TAKEUCHI MIKI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a technique that can wirelessly send accumulated heat stress information while reducing the power consumption.SOLUTION: The semiconductor device includes: a holding circuit having a buffer for measuring heat stress information with an obvious temperature dependence at every specific intervals and having an accumulated stress counter for accumulating the heat stress information of the buffer and holding the information as an accumulated stress counter value; a control circuit including an operation determination threshold value; and a wireless communication circuit. The control circuit starts sending of the accumulated heat stress information calculated from the accumulated stress counter value by the wireless communication circuit on the basis of the shift from a first state, in which the heat stress information given from the buffer is larger than the operation determination threshold value, to a second state, where the heat stress information is smaller than the operation determination threshold value.SELECTED DRAWING: Figure 1 【課題】消費電力を低減しつつ、累積熱ストレス情報を無線送信することが可能な技術を提供することにある。【解決手段】半導体装置は、温度依存性が顕著な熱ストレス情報を所定期間ごとに計測するバッファと、バッファの前記熱ストレス情報を累積して、累積ストレスカウント値として保持する累積ストレスカウンタと、を含む保持回路と、動作判定しきい値を含む制御回路と、無線通信回路と、を有する。制御回路は、バッファから与えられる熱ストレス情報が動作判定しきい値より大きい第1状態から小さい第2状態へ遷移したことに基づいて、無線通信回路による累積ストレスカウント値から算出された累積熱ストレス情報の送信を開始させる。【選択図】図1