MEASUREMENT METHOD AND TESTING DEVICE
To enable strength to be accurately measured even when measuring the strength of a plurality of test pieces.SOLUTION: Provided is a measurement method for measuring the strength of test pieces, the measurement method comprising: a device preparation step ST1 for preparing a testing device that destr...
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Format: | Patent |
Sprache: | eng ; jpn |
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Zusammenfassung: | To enable strength to be accurately measured even when measuring the strength of a plurality of test pieces.SOLUTION: Provided is a measurement method for measuring the strength of test pieces, the measurement method comprising: a device preparation step ST1 for preparing a testing device that destroys a chip and measures the flexural strength of the chip; a load detection step ST2 for placing a chip held by a collet on a pair of long-sized support parts and then pressing and breaking the chip held by the pair of long-sized support parts with an indenter, and detecting a load when the chip is broken with a load measuring instrument; and a cleaning step ST5 for holding a cleaning tool with a collet and moving it to a placement position with a collet movement mechanism after carrying out the load detection step ST2, and cleaning the top edges of support projections of the long-sized support parts with the cleaning tool.SELECTED DRAWING: Figure 12
【課題】複数の試験片の強度を測定する際でも正確に強度を測定することを可能とすること。【解決手段】測定方法は、試験片の強度を測定する測定方法であって、チップを破壊してチップの抗折強度を測定する試験装置を準備する装置準備ステップST1と、コレットで保持したチップを一対の長尺支持部上に載置し、次いで一対の長尺支持部で支持されたチップを圧子で押圧して破壊し、チップが破壊した際の荷重を荷重計測器で検出する荷重検出ステップST2と、荷重検出ステップST2を実施した後に、清掃具をコレットで保持しコレット移動機構で載置位置へと移動させて長尺支持部の支持突起の上端を清掃具で清掃する清掃ステップST5と、を備える。【選択図】図12 |
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