MAGNETIC PARTICLE INSPECTION DEVICE AND MAGNETIC PARTICLE INSPECTION METHOD

To provide a magnetic particle inspection device which can easily distinguish a portion where a flaw is formed from a portion where the flaw is not formed on a surface of an inspection object and accurately inspect the flaw.SOLUTION: A magnetic particle inspection device comprises: a magnetization unit 1 which magnetizes an inspection object MA1; an inspection liquid supply unit 2 which supplies inspection liquid containing fluorescent magnetic particles to the inspection object MA1 to make the fluorescent magnetic particles adhere to the surface of the inspection object MA1; a cleaning liquid supply unit 4 which supplies cleaning liquid FL2 to the inspection object MA1 to wash out the excessive fluorescent magnetic particles; a measurement unit 7 which emits the ultraviolet ray to the surface of the inspection object MA1, images the fluorescence light emitted by the fluorescent magnetic particles and measures the luminance of an acquired image IM1; and an adjustment unit which adjusts the supply of the cleaning liquid FL2 to the inspection object MA1 such that the measurement value of the luminance LM1 of the image IM1 measured by the measurement unit 7 falls within a prescribed range.SELECTED DRAWING: Figure 1 【課題】被検査物の表面のうち、キズが形成されている部分と、キズが形成されていない部分とを、容易に識別でき、キズを精度良く探傷することができる磁粉探傷装置を提供する。【解決手段】磁粉探傷装置は、被検査物ＭＡ１を磁化する磁化部１と、被検査物ＭＡ１に蛍光磁粉を含有する検査液を供給して被検査物ＭＡ１の表面に蛍光磁粉を付着させる検査液供給部２と、被検査物ＭＡ１に洗浄液ＦＬ２を供給し、余剰の蛍光磁粉を洗い流す洗浄液供給部４と、被検査物ＭＡ１の表面に紫外線を照射し、蛍光磁粉が発光する蛍光を撮像して取得された画像ＩＭ１の輝度を測定する測定部７と、測定部７により測定された画像ＩＭ１の輝度ＬＭ１の測定値が予め定められた範囲内に収まるように、被検査物ＭＡ１への洗浄液ＦＬ２の供給を調整する調整部を有する。【選択図】図１