DEVICE ABNORMALITY DIAGNOSTIC METHOD AND DEVICE ABNORMALITY DIAGNOSTIC SYSTEM

To provide an abnormality diagnostic technique of a device, which can perform diagnosis without depending on skills of an engineer.SOLUTION: An abnormality diagnostic method of a device includes steps of: adjusting object data as an object of diagnosis, which are included in data estimating a state...

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Hauptverfasser:	OZAKI KENJI, TAKAKURA KEI, KASHIWASE SHOICHI, NISHI YUYA, HISHINUMA TOMOMI, HIKUMA KOJI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	To provide an abnormality diagnostic technique of a device, which can perform diagnosis without depending on skills of an engineer.SOLUTION: An abnormality diagnostic method of a device includes steps of: adjusting object data as an object of diagnosis, which are included in data estimating a state of a device, in such a manner that a dimensionality of the object data becomes a specific one; analyzing the object data adjusted to have the specific dimensionality by using algorithm handling data with the specific dimensionality; and displaying the object data in such a manner that the presence or absence of abnormality can be identified on the basis of the analysis of the object data.SELECTED DRAWING: Figure 12 【課題】エンジニアの技能に依存せずに診断を行うことができる機器の異常診断技術を提供する。【解決手段】機器の異常診断方法は、機器の状態を示すデータに含まれる診断の対象となる対象データの次元数が特定次元数になるように対象データを調整するステップと、特定次元数に調整された対象データを、特定次元数のデータを扱うアルゴリズムを用いて解析するステップと、対象データの解析に基づいて、異常の有無を識別可能な態様で対象データを表示するステップとを含む。【選択図】図１２