EMISSION CONTROL DEVICE OF CHARGED PARTICLE, METHOD, AND PROGRAM

To provide an emission control technique of a charged particle capable of stably performing a late fetching of a charged particle from a synchrotron even in a state where a beam adjustment is not implemented or unfinished.SOLUTION: An emission control device 10 of a charged particle comprises: a first reception part 11 that receives a first detection signal S1 that detected a current value of a charged particle orbiting in a synchrotron 20; an arithmetic processing part 16 that outputs a beam intensity corresponding value D by performing a time derivative of this first detection signal S1; and an emission control part 18 that outputs a control signal G making a beam transport system 30 emit a charged particle beam 51 from the synchrotron 20 so that the beam intensity corresponding value D matches with a target value 17.SELECTED DRAWING: Figure 1 【課題】ビーム調整が未実施又は未完成の状態でも、シンクロトロンから荷電粒子ビームの遅い取り出しを安定的に行える荷電粒子の出射制御技術を提供する。【解決手段】荷電粒子の出射制御装置１０は、シンクロトロン２０において周回する荷電粒子の電流値を検出した第１検出信号Ｓ１を受信する第１受信部１１と、この第１検出信号Ｓ１を時間微分してビーム強度相当値Ｄを出力する演算処理部１６と、ビーム強度相当値Ｄが目標値１７に一致するようにシンクロトロン２０からビーム輸送系３０に荷電粒子ビーム５１を出射させる制御信号Ｇを出力する出射制御部１８と、を備えている。【選択図】図１