FRACTURE SURFACE ANALYSIS DEVICE AND FRACTURE SURFACE ANALYSIS METHOD

To provide a fracture surface analysis device and a fracture surface analysis method that enable an unskilled person to perform the same fracture surface analysis as an expert.SOLUTION: A fracture surface analysis device comprises first means for calculating the accuracy of a destruction mode for a...

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Hauptverfasser:	UEKI YOSUKE, ISOZAKI YOHEI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	To provide a fracture surface analysis device and a fracture surface analysis method that enable an unskilled person to perform the same fracture surface analysis as an expert.SOLUTION: A fracture surface analysis device comprises first means for calculating the accuracy of a destruction mode for a first observation image obtained from imaging means in a micro region of an object to be analyzed, second means for calculating observation conditions that improve the accuracy of the destruction mode, and third means for adjusting imaging conditions of the imaging means in the micro region, and includes a micro region observation unit configured to output, to visualization means, the accuracy of the destruction mode and the observation conditions that improve the accuracy of the destruction mode.SELECTED DRAWING: Figure 1 【課題】非熟練者でも熟練者と同様の破面解析を実施可能とする破面解析装置及び破面解析方法を提供する。【解決手段】被解析物のミクロな領域の撮像手段から得た第１の観察像について破壊モードの確度を算出する第１の手段と、破壊モードの確度を向上させる観察条件を算出する第２の手段と、ミクロな領域の撮像手段の撮影条件を調整する第３の手段を備え、破壊モードの確度と破壊モードの確度を向上させる観察条件を可視化手段に出力するミクロ領域観察部を含むことを特徴とする。【選択図】図１