TEST MEASUREMENT DEVICE AND METHOD FOR MEASURING PERFORMANCE OF DEVICE UNDER TEST

To measure performance of a DUT based on DQ 0 information.SOLUTION: A test measurement device 40 includes an interface 42 for capturing an analog three-phase signal from a device under test (DUT) and a processor 44. The processor 44 performs DQ0 conversion based on the analog three-phase signal to g...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	U N VASUDEV, VEMPATI L BHARGHAVI, KRISHNA N H SRI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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