TEST MEASUREMENT DEVICE AND METHOD FOR MEASURING PERFORMANCE OF DEVICE UNDER TEST
To measure performance of a DUT based on DQ 0 information.SOLUTION: A test measurement device 40 includes an interface 42 for capturing an analog three-phase signal from a device under test (DUT) and a processor 44. The processor 44 performs DQ0 conversion based on the analog three-phase signal to g...
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| Format: | Patent |
| Sprache: | eng ; jpn |
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| Zusammenfassung: | To measure performance of a DUT based on DQ 0 information.SOLUTION: A test measurement device 40 includes an interface 42 for capturing an analog three-phase signal from a device under test (DUT) and a processor 44. The processor 44 performs DQ0 conversion based on the analog three-phase signal to generate a DQ0 signal. Based on the DQ0 signal, performance of the DUT is measured, such as a ripple, a peak-to-peak amplitude, a DC average value of a DQ0 component, a fast Fourier transform plot of the DQ0 component, magnitude of D and Q, a harmonic measurement value, jitter analysis, and total power of the DQ0.SELECTED DRAWING: Figure 3
【課題】ＤＱ０情報に基づいて、ＤＵＴの性能を測定する。【解決手段】試験測定装置４０は、被試験デバイス（ＤＵＴ）からアナログ三相信号を取り込むインターフェース４２と、プロセッサ４４とを備える。プロセッサ４４は、アナログ三相信号に基づいて、ＤＱ０変換を実行してＤＱ０信号を生成し、ＤＱ０信号に基づいて、リップル、ピーク・ピーク振幅、ＤＱ０成分のＤＣ平均値、ＤＱ０成分の高速フーリエ変換プロット、Ｄ及びＱの大きさ、高調波測定値、ジッタ分析、ＤＱ０の総電力のようなＤＵＴの性能を測定する。【選択図】図３ |
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