INFORMATION PROCESSING DEVICE FOR MACHINE LEARNING, INFORMATION PROCESSING METHOD FOR MACHINE LEARNING, AND INFORMATION PROCESSING PROGRAM FOR MACHINE LEARNING

To improve the accuracy of machine learning using labeled measurement data.SOLUTION: An information processing device 100 for machine learning includes: a data input unit that inputs measurement data measured by measuring means that measures depth information and generates a measurement image based on the measurement data; a label information input unit that inputs label information that is added to a feature quantity related to a target included in the measurement image; an angular information input unit that inputs angular information indicating a measurement direction of the measurement means for each piece of the measurement data; a determination unit that determines the correlation of time series of the feature quantity related to the target included in the measurement image based on the angular information; and a label correction unit that corrects the label information added to the feature quantity related to the target based on a determination result of the correlation.SELECTED DRAWING: Figure 1 【課題】ラベル付けした計測データを用いた機械学習の精度を向上させる。【解決手段】機械学習用情報処理装置１００は、奥行き情報を計測する計測手段によって計測された計測データを入力し、計測データに基づき計測画像を生成するデータ入力部と、計測画像に含まれる目標物に係る特徴量に付与するラベル情報を入力するラベル情報入力部と、計測データごとの計測手段の計測方向を示す角度情報を入力する角度情報入力部と、角度情報に基づいて計測画像に含まれる目標物に係る特徴量の時系列の相関を判定する判定部と、相関の判定結果に基づいて目標物に係る特徴量に付与されたラベル情報を補正するラベル補正部とを備えた。【選択図】図１