APPEARANCE INSPECTION MANAGEMENT SYSTEM, APPEARANCE INSPECTION MANAGEMENT DEVICE, APPEARANCE INSPECTION MANAGEMENT METHOD, AND PROGRAM

To provide technique for assisting a user in selection of the feature quantity that is used as a defect determination index in an appearance inspection device and in setting a threshold for each feature quantity.SOLUTION: An appearance inspection management system is provided that comprises: appearance inspection means inspecting defect of an inspection object on the basis of the feature quantity acquired from an image formed by photographing the inspection object; display means; storage means storing defect image data that includes at least the information of the feature quantity obtained from the image of a portion determined as a defect of the inspection object by the appearance inspection means; feature quantity distribution diagram creation means creating a plurality of feature quantity distribution diagrams in which the information of the feature quantity is mapped in a prescribed coordinate system; and feature quantity selection assistance means causing the display means to display a feature quantity panoramic diagram in which the plurality of feature quantity distribution diagrams created by the feature quantity distribution diagram creation means are arranged in accordance with a prescribed rule.SELECTED DRAWING: Figure 1 【課題】外観検査装置において欠陥判定指標として用いる特徴量の選定、及び特徴量毎の閾値の設定、をユーザーが行うことを支援する技術を提供する。【解決手段】被検査物を撮影した画像から取得する特徴量に基づいて、前記被検査物の欠陥を検査する外観検査手段と、表示手段と、少なくとも、前記外観検査手段により前記被検査物の欠陥と判定された箇所の画像から得られる特徴量の情報を含む欠陥画像データ、を記憶する記憶手段と、所定の座標系に前記特徴量の情報をマッピングした特徴量分布図、を複数作成する特徴量分布図作成手段と、前記特徴量分布図作成手段が作成する複数の特徴量分布図を所定の規則に従って配置した特徴量俯瞰図を、前記表示手段に表示させる特徴量選択補助手段と、を備える外観検査管理システム。【選択図】図１