SEMICONDUCTOR STORAGE DEVICE

To provide a technique capable of appropriately ensuring both of rewritable frequency of data and a retention period of data when using a magnetoresistive memory in a semiconductor storage device.SOLUTION: A semiconductor storage device 20 includes a first magnetoresistive memory 21 and a second mag...

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1. Verfasser: NARUSE MINENOBU
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a technique capable of appropriately ensuring both of rewritable frequency of data and a retention period of data when using a magnetoresistive memory in a semiconductor storage device.SOLUTION: A semiconductor storage device 20 includes a first magnetoresistive memory 21 and a second magnetoresistive memory 22 of two types of magnetoresistive memories accessed by a target logic part 41 which is one of logic parts 40. The target logic part 41, the first magnetoresistive memory 21 and the second magnetoresistive memory 22 are formed into one semiconductor chip and the first magnetoresistive memory 21 is larger in coercive field strength than the second magnetoresistive memory 22.SELECTED DRAWING: Figure 2 【課題】半導体記憶装置に磁気抵抗メモリを用いる場合に、データの書き換え可能回数とデータの保持期間との双方を適切に確保することが可能な技術を実現する。【解決手段】半導体記憶装置20は、1つのロジック部40である対象ロジック部41によりアクセスされる2種類の磁気抵抗メモリである、第1磁気抵抗メモリ21と第2磁気抵抗メモリ22とを備える。対象ロジック部41と第1磁気抵抗メモリ21と第2磁気抵抗メモリ22とが1つの半導体チップに形成され、第1磁気抵抗メモリ21は、第2磁気抵抗メモリ22よりも保磁力が大きい。【選択図】図2