GOLD-COATED SILVER BONDING WIRE AND MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

To provide a gold-coated silver bonding wire capable of suppressing a short circuit or the like due to ion migration between ball compression portions.SOLUTION: A gold-coated silver bonding wire 1 includes a core material 2 containing silver as a main component and a coating layer 3 provided on the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KAWANO SHOTA, YASUTOKU YUKI, SAKITA YUSUKE
Format: Patent
Sprache:eng ; jpn
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:To provide a gold-coated silver bonding wire capable of suppressing a short circuit or the like due to ion migration between ball compression portions.SOLUTION: A gold-coated silver bonding wire 1 includes a core material 2 containing silver as a main component and a coating layer 3 provided on the surface of the core material 2 and containing gold as a main component. The gold-coated silver bonding wire 1 contains gold in the range of 2 mass% or more and 7 mass% or less and contains at least one sulfur group element selected from sulfur, selenium, and tellur in the range of 1 mass% or more and 80 mass% or less with respect to the total amount of the wire.SELECTED DRAWING: Figure 1 【課題】ボール圧縮部間のイオンマイグレーションに基づく短絡等を抑制することを可能にした金被覆銀ボンディングワイヤを提供する。【解決手段】金被覆銀ボンディングワイヤ1は、銀を主成分として含む芯材2と、芯材2の表面に設けられ、金を主成分として含む被覆層3とを有する。金被覆銀ボンディングワイヤ1は、ワイヤの全体量に対して、2質量%以上7質量%以下の範囲で金を含み、かつ1質量ppm以上80質量ppm以下の範囲で硫黄、セレン、及びテルルから選ばれる少なくとも1つの硫黄族元素を含む。【選択図】図1