SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICE

To reduce the cost of manufacturing a semiconductor device by reducing the size of an additional circuit while maintaining the function of an LBIST test.SOLUTION: The semiconductor device according to the present invention runs a self-test, and includes: a plurality of circuit blocks 50 for receivin...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KUSAKARI KEN
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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