SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICE

To reduce the cost of manufacturing a semiconductor device by reducing the size of an additional circuit while maintaining the function of an LBIST test.SOLUTION: The semiconductor device according to the present invention runs a self-test, and includes: a plurality of circuit blocks 50 for receivin...

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Bibliographische Detailangaben
1. Verfasser:	KUSAKARI KEN
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	To reduce the cost of manufacturing a semiconductor device by reducing the size of an additional circuit while maintaining the function of an LBIST test.SOLUTION: The semiconductor device according to the present invention runs a self-test, and includes: a plurality of circuit blocks 50 for receiving an input of a pattern; and a comparator 302 for acquiring a test response based on a response that each circuit block outputs in response to the input of the pattern and obtaining the result of the self-test of the circuit block by comparing with the reference value. The plurality of circuit blocks share the pattern input.SELECTED DRAWING: Figure 5 【課題】ＬＢＩＳＴテストの機能を維持しながらも、追加される回路規模を削減することにより、半導体装置の製造コストを低減する。【解決手段】本発明の半導体装置は、自己テストを行う半導体装置であって、パタン入力を受け付ける複数の回路ブロック５０と、前記パタン入力に対して前記複数の回路ブロックの各々が出力する応答を起源とするテスト応答を取得し、基準値と比較することで当該回路ブロックの前記自己テストの結果を得る比較器３０２と、を備え、前記パタン入力を、前記複数の回路ブロックが共用する。【選択図】図５