DISTANCE MEASURING DEVICE AND ABNORMALITY DETERMINATION METHOD IN DISTANCE MEASURING DEVICE
To perform self-determination of abnormality relating to at least one of a light receiving unit and a light emitting unit in a distance measuring device.SOLUTION: A distance measuring device 100 comprises: a light receiving unit 30 having a plurality of light receiving regions for receiving incident...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng ; jpn |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | To perform self-determination of abnormality relating to at least one of a light receiving unit and a light emitting unit in a distance measuring device.SOLUTION: A distance measuring device 100 comprises: a light receiving unit 30 having a plurality of light receiving regions for receiving incident light and executing reception of incident light in units of each light receiving region; and a light emitting unit 20 for executing irradiation with detection light exclusively in correspondence to each light receiving region. The distance measuring device 100 further includes an abnormality determination unit 10 which, when receiving incident light by light receiving units in accordance with irradiation with detection light, performs abnormality determination in the distance measuring device in accordance with a difference between the characteristic of incident light intensity in a light receiving region, among the plurality of light receiving regions, that corresponds to exclusive irradiation with detection light and the characteristic of incident light intensity in a non-light receiving region that does not correspond to exclusive irradiation with detection light.SELECTED DRAWING: Figure 2
【課題】測距装置において受光部および発光部の少なくともいずれか一方に関する異常の自己判定を行うこと。【解決手段】測距装置100は、入射光を受光するための複数の受光領域を有し、各受光領域を単位として入射光の受光を実行する受光部30と、各受光領域に対応して排他的に検出光の照射を実行する発光部20とを備える。測距装置100はさらに、検出光の照射に応じて受光部により入射光を受光する際に、複数の受光領域のうち、排他的な検出光の照射に対応する受光対象領域における入射光強度の特性と排他的な検出光の照射に対応しない受光非対象領域における入射光強度の特性との相違に応じて測距装置における異常判定を行う異常判定部10を備える。【選択図】図2 |
---|