MICROCHIP INSPECTION METHOD AND MICROCHIP INSPECTION DEVICE

To provide a microchip inspection method with which it is possible to detect the presence of a weld line with high accuracy that affects inspection.SOLUTION: An inspection method for a flow channel chip that includes a main flow channel 2, a first electrode port 21 provided with a plurality of ports...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SHIMURA YUSAKU, YAKUMARU KOSUKE
Format: Patent
Sprache:eng ; jpn
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!