CHARACTERISTIC MEASUREMENT DEVICE, COMPONENT MOUNTING APPARATUS, CHARACTERISTIC MEASUREMENT METHOD, AND COMPONENT MOUNTING METHOD
To provide a characteristic measurement device capable of easily exchanging a measurement substrate on which measurement electrodes for measuring electrical characteristics of electronic components are formed, a component mounting apparatus, a characteristic measurement method and a component mounti...
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Sprache: | eng ; jpn |
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Zusammenfassung: | To provide a characteristic measurement device capable of easily exchanging a measurement substrate on which measurement electrodes for measuring electrical characteristics of electronic components are formed, a component mounting apparatus, a characteristic measurement method and a component mounting method.SOLUTION: The characteristic measurement device includes: a fixing part on which multiple fixed contacts are arranged on a mounting plane; and a measurement unit 50 removably mounted on the mounting plane. The measurement unit 50 includes: a measurement board 60 in which multiple electrodes 61 which are electrically connected to an electronic component are formed on the upper face thereof, and multiple-unit side contacts are formed for electrically connecting the multiple electrodes 61 and multiple fixed contacts on the lower face thereof; and a substrate holding member 52 in which a measurement opening 52a is formed for placing an electronic component to the measurement position of the mounted measurement board 60.SELECTED DRAWING: Figure 7
【課題】電子部品の電気的特性を計測する計測用の電極が形成された計測用基板を容易に交換することができる特性計測装置、部品実装装置、特性計測方法および部品実装方法を提供する。【解決手段】特性計測装置は、装着面に複数の固定側接点が配置された固定部と、装着面に着脱可能に装着される計測ユニット50と、を備えている。計測ユニット50は、上面に電子部品と電気的に接続される複数の電極61が形成され、下面に複数の電極61および複数の固定側接点とそれぞれ電気的に接続される複数のユニット側接点が形成された計測用基板60と、装着された計測用基板60の計測位置に電子部品を置くための計測開口52aが形成された基板保持部材52と、を有している。【選択図】図7 |
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